APMC2017 – Asia Pacific Microwave Conference

Raj Raj Ramakrishnan; Sean Lee
Keysight, Malaysia

IND 3: IoT Industry 1
Room, Time & Date: ROOM 02 | 13:40 – 14:00 | Wednesday, 15 November 2017

 

An Overview of IoT Trends and Key Test Challenges

Abstract: The Internet of Things (IoT) has become increasingly prevalent in our daily lives. From smart home appliances to wearable healthcare devices, as well as wireless sensor nodes within smart grid systems and smart cities. Designers and manufacturers face unique challenges when testing IoT smart devices where new hardware must support multiple wireless platforms with low power consumption as well as support multiple wireless formats to ensure interoperability between different vendors and systems. In this presentation, we will take a look at what are the key wireless standards in IoT and discuss some of the key test and design challenges of IoT devices.