APMC2017 – Asia Pacific Microwave Conference

Steven Huang
Keysight, Malaysia

IND 2: Special Session Microwave Industry in Malaysia 1
Room, Time & Date: ROOM 02 | 11:20 – 11:40 | Wednesday, 15 November 2017

 

Millimeter Wave Component Characterization

Abstract: With the increased demand for the transfer of a large volume of data at high speeds, there is an increasing need to utilize the millimeter wave frequency band. This places an increased demand on designers and manufacturers in the industry to fully characterize and test both active and passive components at the millimeter wave frequencies. This webcast will focus on how a Vector Network Analyzer can be utilized to address the need for millimeter wave component characterization for both passive and active devices.